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Webster's Online Dictionary | Login | |
| Expressions | Domain | Definition | |
| Inspector, semiconductor wafer | Occupations | Performs any of following duties to inspect, measure, and test semiconductor wafers for conformance to specifications: Inspects wafers under high intensity lamp to detect surface defects, such as scratches, chips, stains, burns, or haze. Measures thickness and resistivity of wafers, using electronic gauges or automated sorting machine. Measures diameter and $T3flat$T1 of wafers, using calipers. Inspects bow or flatness of wafers, using electronic gauges, or examines surface of wafers under high intensity lamp. Tests for positive or negative conductivity of wafers, using electronic probe and gauge. Determines $T3crystal orientation$T1 of wafers, using x-ray equipment. Encloses containers of inspected wafers in plastic bags for protection, using heat sealer. Records inspection data on production records or in computer, using computer terminal. May tend equipment that cleans surface of wafers [WAFER CLEANER (electron.comp.) 590.685-102]. (references) | |
| Inspector, semiconductor wafer processing | Occupations | Inspects semiconductor wafers, using microscope, to identify processing defects: Places wafers on stage of microscope, using tweezers or vacuum wand. Examines surface of wafer and test patterns on wafers, using microscope, and compares wafers to specification diagrams to identify processing defects, such as scratches, contamination, pattern misalignment, photoresist peel, and circuit bridges. Measures specified dimensions of test patterns on wafers, using electronic measuring devices attached to microscope at work station, to verify that wafers meet company specifications. Routes defective wafers to engineering department. Records observations onto processing sheets and log. Cleans inspecting area, using cleaning solution. (references) | |
Source: compiled by the editor from various references; see credits. | Top | ||